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?2002 fairchild semiconductor corporation www.fairchildsemi.com rev. 1.0.5 features ? output current up to 0.5a ? output voltages of 5, 6, 8, 12, 15, 18, 24v ? thermal overload protection ? short circuit protection ? output transistor safe operating area (soa)protection description the mc78mxx/lm78mxx series of three-terminal positive regulators are available in the to-220/d-pak package with several fixed output voltages making it useful in a wide range of applications. to-220 d-pak 1. input 2. gnd 3. output 1 1 gnd gnd internal block digram output 3 r1 r2 gnd 2 1 input series pass element soa protection current generator starting circuit reference voltage error amplifier thermal protection mc78mxx/lm78mxx 3-terminal 0.5a positive voltage regulator
mc78mxx/lm78mxx 2 absolute maximum ratings note: 1. thermal resistance test board size: 76.2mm * 114.3mm * 1.6mm(1s0p) jedec standard: jesd51-3, jesd51-7 2. assume no ambient airflow electrical characteristics (mc78m05/lm78m05) (refer to the test circuits, 0 < t j < +125 c, i o =350ma, v i =10v, unless otherwise specified, c i = 0.33 f, c o =0.1 f) note: 3. load and line regulation are specified at constant junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. parameter symbol value unit input voltage (for v o = 5v to 18v) (for v o = 24v) v i v i 35 40 v v thermal resistance junction-case (note1) to-220 (tc = +25 c) r jc 2.5 c/w thermal resistance junction-air (note1, 2) to-220 (ta = +25 c) d-pak (ta = +25 c) r ja 66 92 c/w operating junction temperature range t opr 0 ~ +150 c storage temperature range t stg -65 ~ +150 c parameter symbol conditions min. typ. max. unit output voltage v o t j = +25 c 4.855.2 v i o = 5ma to 350ma v i = 7v to 20v 4.75 5 5.25 line regulation (note3) ? v o i o = 200ma t j =+25 c v i = 7v to 25v - - 100 mv v i = 8v to 25v - - 50 load regulation (note3) ? v o i o = 5ma to 0.5a, t j =+25 c - - 100 mv i o = 5ma to 200ma, t j =+25 c- - 50 quiescent current i q t j =+25 c-4.06.0ma quiescent current change ? i q i o = 5ma to 350ma - - 0.5 ma i o = 200ma v i = 8v to 25v --0.8 output voltage drift ? v/ ? t i o = 5ma t j = 0 to +125 c --0.5-mv/ c output noise voltage v n f = 10hz to 100khz - 40 - v/vo ripple rejection rr f = 120hz, i o = 300ma v i = 8v to 18v, t j =+25 c -80- db dropout voltage v d t j =+25 c, i o = 500ma - 2 - v short circuit current i sc t j =+25 c, v i = 35v - 300 - ma peak current i pk t j =+25 c - 700 - ma
mc78mxx/lm78mxx 3 electrical characteristics (mc78m06) (continued) (refer to the test circuits, 0 < t j < +125 c, i o =350ma, v i =11v, unless otherwise specified, c i =0.33 f, c o =0.1 f) note: 1. load and line regulation are specified at constant junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. parameter symbol conditions min. typ. max. unit output voltage v o t j = +25 c 5.75 6 6.25 v i o = 5ma to 350ma v i = 8v to 21v 5.7 6 6.3 line regulation (note1) ? v o i o = 200ma t j = +25 c v i = 8v to 25v - - 100 mv v i = 9v to 25v - - 50 load regulation (note1) ? v o i o = 5ma to 0.5a, t j = +25 c - - 120 mv i o = 5ma to 200ma, t j = +25 c- -60 quiescent current i q t j = +25 c-4.06.0ma quiescent current change ? i q i o = 5ma to 350ma - - 0.5 ma i o = 200ma v i = 9v to 25v --0.8 output voltage drift ? v/ ? t i o = 5ma t j = 0 to +125 c --0.5-mv/ c output noise voltage v n f = 10hz to 100khz - 45 - v/vo ripple rejection rr f = 120hz, i o = 300ma v i = 9v to 19v, t j =+25 c -80-db dropout voltage v d t j =+25 c, i o = 500ma - 2 - v short circuit current i sc t j = +25 c, v i = 35v - 300 - ma peak current i pk t j =+25 c - 700 - ma
mc78mxx/lm78mxx 4 electrical characteristics (mc78m08) (continued) (refer to the test circuits, 0 < t j < +125 c, i o =350ma, v i =14v, unless otherwise specified, c i = 0.33 f, c o =0.1 f) note: 1. load and line regulation are specified at constant junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. parameter symbol conditions min. typ. max. unit output voltage v o t j =+25 c7.788.3 v i o = 5ma to 350ma v i = 10.5v to 23v 7.6 8 8.4 line regulation (note1) ? v o i o = 200ma t j =+25 c v i = 10.5v to 25v - - 100 mv v i = 11v to 25v - - 50 load regulation (note1) ? v o i o = 5ma to 0.5a, t j =+25 c - - 160 mv i o = 5ma to 200ma, t j =+25 c--80 quiescent current i q t j = +25 c-4.06.0ma quiescent current change ? i q i o = 5ma to 350ma - - 0.5 ma i o = 200ma v i = 10.5v to 25v --0.8 output voltage drift rr i o = 5ma t j = 0 to +125 c - ? 0.5 - mv/ c output noise voltage v n f = 10hz to 100khz - 52 - v/vo ripple rejection rr f = 120hz, i o = 300ma v i = 11.5v to 21.5v, t j =+25 c -80- db dropout voltage v d t j = +25 c, i o = 500ma - 2 - v short circuit current i sc t j = +25 c, v i = 35v - 300 - ma peak current i pk t j = +25 c - 700 - ma
mc78mxx/lm78mxx 5 electrical characteristics (mc78m12) (continued) (refer to the test circuits, 0 < t j < +125 c, i o =350ma, v i =19v, unless otherwise specified, c i =0.33 f, c o =0.1 f) note: 1. load and line regulation are specified at constant junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. parameter symbol conditions min. typ. max. unit output voltage v o t j = +25 c 11.5 12 12.5 v i o = 5ma to 350ma v i = 14.5v to 27v 11.4 12 12.6 line regulation (note1) ? v o i o = 200ma t j = +25 c v i = 14.5v to 30v - - 100 mv v i = 16v to 30v - - 50 load regulation (note1) ? v o i o = 5ma to 0.5a, t j = +25 c - - 240 mv i o = 5ma to 200ma, t j = +25 c - - 120 quiescent current i q t j =+25 c-4.16.0ma quiescent current change ? i q i o = 5ma to 350ma - - 0.5 ma i o = 200ma v i = 14.5v to 30v --0.8 output voltage drift ? v/ ? t i o = 5ma t j = 0 to +125 c --0.5-mv/ c output noise voltage v n f = 10hz to 100khz - 75 - v/vo ripple rejection rr f = 120hz, i o = 300ma v i = 15v to 25v, t j =+25 c -80- db dropout voltage v d t j =+25 c, i o = 500ma - 2 - v short circuit current i sc t j = +25 c, v i = 35v - 300 - ma peak current i pk t j = +25 c - 700 - ma
mc78mxx/lm78mxx 6 electrical characteristics (mc78m15) (continued) (refer to the test circuits, 0 < t j < +125 c, i o =350ma, v i =23v, unless otherwise specified, c i =0.33 f, c o =0.1 f) note: 1. load and line regulation are specified at constant junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. parameter symbol conditions min. typ. max. unit output voltage v o t j = +25 c 14.4 15 15.6 v i o = 5ma to 350ma v i = 17.5v to 30v 14.25 15 15.75 line regulation (note1) ? v o i o = 200ma t j =+25 c v i = 17.5v to 30v - - 100 mv v i = 20v to 30v - - 50 load regulation (note1) ? v o i o = 5ma to 0.5a, t j =+25 c - - 300 mv i o = 5ma to 200ma, t j =+25 c - - 150 quiescent current i q t j = +25 c-4.16.0ma quiescent current change ? i q i o = 5ma to 350ma - - 0.5 ma i o = 200ma v i = 17.5v to 30v --0.8 output voltage drift ? v/ ? t i o = 5ma t j = 0 to +125 c --1 -mv/ c output noise voltage v n f = 10hz to 100khz - 100 - v/vo ripple rejection rr f = 120hz, i o = 300ma v i = 18.5v to 28.5v, t j =+25 c -70 - db dropout voltage v d t j =+25 c, i o = 500ma - 2 - v short circuit current i sc t j = +25 c, v i = 35v - 300 - ma peak current i pk t j = +25 c - 700 - ma
mc78mxx/lm78mxx 7 electrical characteristics (mc78m18) (continued) (refer to the test circuits, 0 < t j < +125 c, i o =350ma, v i =26v, unless otherwise specified, c i =0.33 f, c o =0.1 f) note: 1. load and line regulation are specified at constant junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. parameter symbol conditions min. typ. max. unit output voltage v o t j = +25 c 17.3 18 18.7 v i o = 5ma to 350ma v i = 20.5v to 33v 17.1 18 18.9 line regulation (note1) ? v o i o = 200ma t j = +25 c v i = 21v to 33v - - 100 mv v i = 24v to 33v - - 50 load regulation (note1) ? v i o = 5ma to 0.5a, t j = +25 c - - 360 mv i o = 5ma to 200ma, t j = +25 c - - 180 quiescent current i q t j = +25 c-4.26.0ma quiescent current change ? i q i o = 5ma to 350ma - - 0.5 ma i o = 200ma v i = 21v to 33v --0.8 output voltage drift ? v/ ? ti o = 5mat j = 0 to 125 c--1.1-mv/ c output noise voltage v n f = 10hz to 100khz - 100 - v/vo ripple rejection rr f = 120hz, i o = 300ma , v i = 22v to 32v t j =+25 c -70 - db dropout voltage v d t j = +25 c, i o = 500ma - 2 - v short circuit current i sc t j = +25 c, v i = 35v - 300 - ma peak current i pk t j = +25 c - 700 - ma
mc78mxx/lm78mxx 8 electrical characteristics (mc78m24) (continued) (refer to the test circuits, 0 < t j < +125 c, i o =350ma, v i =33v, unless otherwise specified, c i =0.33 f, c o =0.1 f) note: 1. load and line regulation are specified at constant junction temperature. change in v o due to heating effects must be taken into account separately. pulse testing with low duty is used. parameter symbol conditions min. typ. max. unit output voltage v o t j =+25 c232425 v i o = 5ma to 350ma v i = 27v to 38v 22.8 24 25.2 line regulation (note1) ? v o i o = 200ma t j =+25 c v i = 27v to 38v - - 100 mv v i = 28v to 38v - - 50 load regulation (note1) ? v o i o = 5ma to 0.5a, t j =+25 c - - 480 mv i o = 5ma to 200ma, t j =+25 c - - 240 quiescent current i q t j = +25 c-4.26.0ma quiescent current change ? i q i o = 5ma to 350ma - - 0.5 ma i o = 200ma v i = 27v to 38v --0.8 output voltage drift ? v/ ? t i o = 5ma t j = 0 to +125 c --1.2-mv/ c output noise voltage v n f = 10hz to 100khz - 170 - v/vo ripple rejection rr f = 120hz, i o = 300ma v i = 28v to 38v, t j =+25 c -70- db dropout voltage v d t j = +25 c, i o = 500ma - 2 - v short circuit current i sc t j = +25 c, v i = 35v - 300 - ma peak current i pk t j = +25 c - 700 - ma
mc78mxx/lm78mxx 9 typical applications figure 1. fixed output regulator figure 2. constant current regulator notes: 1. to specify an output voltage, substitute voltage value for "xx" 2. although no output capacitor is needed for stability, it does improve transient response. 3. c i is required if regulator is located an appreciable distance from power supply filter figure 3. circuit for increasing output voltage 0.1 f c o c i 0.3 f v o v i mc78mxx lm78mxx 1 3 2 0.1 f c o c i 0.33 f i o v i mc78mxx lm78mxx 1 3 2 vxx i o r 1 i o = r 1 +i o vxx 0.1 f c o c i 0.33 f i o v i mc78mxx lm78mxx 1 3 2 v xx v o r 1 r 2 i r1 5i o v o = v xx (1+r 2 /r 1 ) +i o r 2
mc78mxx/lm78mxx 10 figure 4. adjustable output regulator (7 to 30v) figure 5. 0.5 to 10v regulator 0.1 f c o c i 0.33 f v o v i mc78m05 lm78m05 1 3 2 10k ? 3 2 4 7 6 lm741 0.1 f c2 c1 0.33 f v o v i mc78m05 lm78m05 1 3 2 10k ? 3 2 4 7 6 lm741 r3 r1 vxx r4 r5 910 ? 9.1k ? 13v < v i < 25v -7 < -vi < 17v _ + vo = vxx r 1 r 4
mc78mxx/lm78mxx 11 mechanical dimensions package dimensions in millimeters 4.50 0.20 9.90 0.20 1.52 0.10 0.80 0.10 2.40 0.20 10.00 0.20 1.27 0.10 ?.60 0.10 (8.70) 2.80 0.10 15.90 0.20 10.08 0.30 18.95max. (1.70) (3.70) (3.00) (1.46) (1.00) (45 ) 9.20 0.20 13.08 0.20 1.30 0.10 1.30 +0.10 ?.05 0.50 +0.10 ?.05 2.54typ [2.54 0.20 ] 2.54typ [2.54 0.20 ] to-220
mc78mxx/lm78mxx 12 mechanical dimensions (continued) package dimensions in millimeters 6.60 d-pak
mc78mxx/lm78mxx 13 ordering information product number package operating temperature lm78m05ct to-220 0 ~ +125 c product number package operating temperature mc78m05ct to-220 0 ~ +125 c mc78m06ct mc78m08ct mc78m12ct mc78m15ct mc78m18ct mc78m24ct mc78m05cdt d-pak MC78M06CDT mc78m08cdt mc78m12cdt
mc78mxx/lm78mxx 11/12/02 0.0m 001 stock#dsxxxxxxxx ? 2002 fairchild semiconductor corporation life support policy fairchild?s products are not authorized for use as critical components in life support devices or systems without the express written approval of the president of fairchild semiconductor corporation. as used herein: 1. life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. a critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com disclaimer fairchild semiconductor reserves the right to make changes without further notice to any products herein to improve reliability, function or design. fairchild does not assume any liability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights, nor the rights of others.

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